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MODELLING AND OPTIMIZATION OF SUBTHRESHOLD LEAKAGE CURRENT IN LOW-POWER, SILICON-BASED, COMPLEMENTARY METAL OXIDE SEMICONDUCTOR (CMOS) DEVICES
(International Journal of Engineering Applied Sciences and Technology, 2019)
The trend of process scaling for CMOS
technology has made subthreshold leakage reduction a
growing concern for submicron circuit designers.
Power consumption has become a principle design
consideration as device ...