Browsing Journals articles by Subject "MOS, CMOS, low power, threshold voltage, subthreshold leakage current, channel length, channel width, DIBL, load capacitance (CL), supply voltage (Vdd), BSIM MOS."
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MODELLING AND OPTIMIZATION OF SUBTHRESHOLD LEAKAGE CURRENT IN LOW-POWER, SILICON-BASED, COMPLEMENTARY METAL OXIDE SEMICONDUCTOR (CMOS) DEVICES
(International Journal of Engineering Applied Sciences and Technology, 2019)The trend of process scaling for CMOS technology has made subthreshold leakage reduction a growing concern for submicron circuit designers. Power consumption has become a principle design consideration as device ...